Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
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Y. Sun "Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach"
IET | English | 2007-01-01 | ISBN: 0863417450 | 416 pages | PDF | 3 MB
IET | English | 2007-01-01 | ISBN: 0863417450 | 416 pages | PDF | 3 MB
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